Micro PIXE analyses of Furnace and Converter Mattes for the determination of trace element distribution and concentrations
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Date
2006
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Abstract
Analyses of the constituent matte phases by Particle Induced X-ray emission (PIXE) were performed to investigate the distribution and concentration of trace elements. These levels of sensitivity are beyond that of the electron microprobe. The objective of these analyses was to examine low level concentrations (ppm or ppb) in phases such as alloys, oxides and sulphides. The analyses were done at the nuclear microprobe chamber of Material Research Group in iThemba LABS. Samples consisted of slow cooled furnace and converter mattes which were prepared at Mintek. The samples were first analysed using SEM/EDX techniques to characterise the phases present, XRD was also performed to characterise the sample but due to the complexity of the samples it was unsuccessful. The SEM images were used to position the samples during experiments in the nuclear microprobe. Each phase was analysed to determine the distribution and concentration of the major and trace elements. The proton beam can be scanned in the same way as the electron microprobe, generating a map; this map indicates concentration as a function of position, the map includes a distant bar and concentration bar which is in weight percent. Also included are tables which contain the results of all the phases which were analysed. To confirm the presence of low. level trace elements, inductively coupled plasma mass spectrometry (ICP-MS) was performed on the samples at the University of Stellenbosch, this technique was also unsuccessful. Interesting information about PGEs and Au was obtained, as well as information about other elements such as Mo, W. Se, As. Bi. Pb. Sn, Sb and many more. Information such as there distribution and concentration in the phases, and the association they have with each other.
Description
A dissertation submitted in partial fulfillment of the requirements for the
degree of Master of Science in Physics at the University of Zululand, 2006.
Keywords
Particle Induced X-ray emission